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Index
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- Welcome to PRIME 2005
- 25-28 July 2005
- Ph.D. Research In Micro-Electronics & Electronics
- The purpose of this Conference is to:
- Encourage favourable exposure to Ph.D. students in the early stage of their career
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- Benchmark Ph.D. research in a friendly and cooperative environment
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- Enable sharing of Ph.D. and supervisors experience on scientific research
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- Rule:
| This Conference can be attended by anyone. However, all articles presented must have a Ph.D student as the first author |
- The important dates are the following:
- Submission deadline of a two pages (maximum) draft: February 15, 2005
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- Notification of acceptance: April 15, 2005
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- Camera ready deadline of a four pages (maximum) article: June 1st, 2005
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- Two pages Draft Submission:
| IEEE-PRIME invites submissions from Students pursuing their Ph.D. in the topics of interest. A two pages (maximum) draft is required (Submission deadline: February 15, 2005 . PDF file to be sent to prime@epfl.ch). This includes title, author(s) (a Ph.D. student must be the first author), affiliation and a concise and clear description of the work. The templates can be found at "paper submission". |
- The draft should include the following information:
- Originality of research: clearly state what is new. The degree of novelty will be one of the major evaluation criteria in the review process. Relate the work to existing previous work in the field.
- Motivation: this is where the author(s) describe the background of the work and presents the used technology.
- Results: it is mandatory to provide results. Illustrate approach and latest results by referring to Figures and Tables. Give existing results and not expected performances. Accuracy and state-of-the-art achievements are a must !
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- The accepted articles will be rated on reviewing scores according to:
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 Top 10% will receive the GOLD LEAF Certificate
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 10-20% will receive the SILVER LEAF Certificate
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 20-30% will receive the BRONZE LEAF Certificate
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- IEEE Xplore:
- After the conference, the accepted articles will be available on IEEE Xplore
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